LPCVD (Amorphous / Polycrystalline Silicon Deposition).
Horizontal LPCVD Furnace
Operating
Model: LH2
Function: 1.High-quality polysilicon deposition at approximately 630°C (process gas: silane); 2.High-quality amorphous silicon deposition at approximately 540°C.
Engineer: Li / +86-21- 34206126-6015 / lijinxi@1
Location: West Area – High-Temperature Furnace
Equipment ID: WDFSLPF01
  • Basic Equipment Information
  • Operating Principle
  • Typical Application Case
Main Applications

This system is used for depositing polysilicon or amorphous silicon thin films via Low-Pressure Chemical Vapor Deposition (LPCVD). The deposited films exhibit high quality and are critical in micro/nano fabrication, especially in silicon-based CMOS processes.

 

Process / Testing Capabilities

Deposition of polysilicon and amorphous silicon thin films using LPCVD. Typical process temperature: around 600°C. Film thickness range: approximately 30 nm to 400 nm. Film uniformity: within 3%.

 

Technical Specifications

Suitable for wafers up to 6 inches. LPCVD-based thin film deposition for both polysilicon and amorphous silicon.

Using LPCVD, silane (SiH₄) decomposes at elevated temperatures to form silicon thin films, which are deposited onto silicon substrates.

 

Polysilicon thin film deposition in CMOS fabrication processes.

Only 3”–6”silicon wafers (round wafers) are allowed. Post-processed wafers are strictly prohibited.
The list below shows FAQs (click a question to view the answer). If your question is not listed, you can leave a message using the link.
FAQs
  • 01
    What is the typical process temperature?
    Approximately 600°C
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