Accurately measure the reflectance or transmittance of thin films at different wavelengths, evaluate the light transmittance, reflectivity and absorption characteristics of thin films, and determine whether they meet the design requirements of optical devices such as optical filters and solar cell films. It can also be used for process monitoring and finished product inspection in semiconductor and optical coating processes.

Process/Testing Capabilities

It is used to measure the transmission and reflection spectra of thin films. The absorption spectra in the ultraviolet-visible band can reflect information such as impurities and band gap width of thin films, and this measurement method is non-destructive.

Technical Specifications

• Maximum wavelength test range: 200 nm~2500 nm; wavelength resolution adjustable from 0.17 nm to 5 nm
• Wavelength accuracy: ±0.15 nm in UV-Vis region, ±0.5 nm in near-infrared region
• Integrating sphere: 100 mm diameter PbS integrating sphere
• Sample size: larger than 14 mm×27 mm and no more than 4 inches. For other sample sizes, please contact the equipment administrator.